Keterangan :

Technical Specifications EDX2800 XRF X-ray Fluorescence Spectrometer
Element can be testedt: 75 elements from sulfur to uranium
Measurement time: 60- 300s
Energy revolution: 165± 5eV
High voltage 5-50 kV
Tube current 50-1000¼ A
Ambient temperature range: 15-30° C
The element content range can be tested 1ppm-99.99%
Power supply: AC 220V± 5V ( AC purified stabilized voltage power supply is suggested)
Weight: 60Kg
Select filter automatically
Switch collimator automatically and freely
Electro-refrigeration silicon pin semiconductor detector
Enhanced metal element sensitivity analyzer
Triple safety protection mode
Independent matrix effect correction model
Multi-variant non-linear regression procedure
Arbitrary optional analysis and identification model
Can analyze 24 elements simultaneously
Instrument Configuration:

* Signal-to-Noise Enhancer ( SNE) .
* Switch collimators and filters automatically
for different samples
* Unique light path enhancement system,
convenient for users to observe samples
more accurately
* Used for RoHS substances detection,
plating coating and full element analysis,
one machine for multi purposes
* Electro- refrigeration silicon pin
semiconductor detector, without liquid
nitrogen refrigeration
* Specially developed measurement
software with user friendly operation interface
* Inbuilt high resolution camera, convenient for
users to analyze samples at any moment
* Precise movable platform, can adjust the position of samples more accurately
and conveniently
* An attractive and fashionable design
* Size of sample chamber: 605* 395* 100mm